Quantitative nanoscopy: Tackling sampling limitations in (S)TEM imaging of polymers and composites
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- 作者：Karthikeyan Gnanasekaran ; Roderick Snel ; Gijsbertus de With ; G.deWith@tue.nl" class="auth_mail" title="E-mail the corresponding author ; Heiner Friedrich
- 关键词：Automatic image acquisition and stitching ; Large-scale image analysis ; Polymer materials ; Quantitative image analysis ; Sampling limitation ; (scanning) Transmission electron microscopy.
- 刊名：Ultramicroscopy
- 出版年：2016
- 出版时间：January 2016
- 年：2016
- 卷：160
- 期：Complete
- 页码：130-139
- 全文大小：4360 K
文摘
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Sampling limitations in EM overcome by automatically acquiring series of partially overlapping images.
Data acquisition for both STEM and TEM mode (TU/e Acquisition ToolBox, implemented for FEI TEMs).
Large-scale maps generated from acquired data with (TU/e Stitcher).
Quantitative image analysis of large-scale maps provides representative information for hierarchical materials.