Graphics cards based topography artefacts simulations in Scanning Thermal Microscopy

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• 作者：Petr Klapetek^a ; ^b ; ^{pklapetek@cmi.cz} ; Jan Martinek^a ; ^c ; Petr Grolich^a ; Miroslav Valtr^a ; ^b ; Nupinder Jeet Kaur^a ; ^b
• 关键词：SThM ; Artefacts
• 刊名：International Journal of Heat and Mass Transfer
• 出版年：2017
• 出版时间：May 2017
• 年：2017
• 卷：108
• 期：part_PA
• 页码：841-850
• 全文大小：1850 K
• 卷排序：108

文摘

Paper presents a methodology and associated computational tool for fast simulations of whole Scanning Thermal Microscopy images, aiming to bridge the gap between the probe-sample interaction simulations and experiments in SThM. Pixel-by-pixel simulations of SThM images are suitable for advanced analysis of sample thermal properties and for topography artefacts simulations. By use of graphics card and a simple Finite Difference scheme we are able to reduce time necessary for complete virtual SThM image simulation to few hours, which is necessary prerequisite for practical use of such numerical analysis in routine data analysis.