Low-noise multichannel ASIC for high count rate X-ray diffractometry applications

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• 作者：R. Szczygiel ; P. Grybos ; P. Maj ; A. Tsukiyama ; K. Matsushita ; T. Taguchi
• 关键词：ASIC ; X-ray imaging ; Silicon strip detector
• 刊名：Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
• 出版年：2009
• 出版时间：1 August 2009
• 年：2009
• 卷：607
• 期：1
• 页码：229-232
• 全文大小：359 K

文摘

RG64 is a 64-channel ASIC designed for the silicon strip detector readout and optimized for high count rate X-ray imaging applications. In this paper we report on the test results referring to the RG64 noise level, channel uniformity and the operation with a high rate of input signals. The parameters of the RG64-based diffractometry system are compared with the ones based on the scintillation counter. Diffractometry measurement results with silicon strip detectors of different strip lengths and strip pitch are also presented.