Identification of genomic region associated with rice weevil resistance in sorghum [Sorghum bicolor (L.) Moench]

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• 作者：Guowei Zhai ; Hua Wang ; Sujuan Li ; Heqing Liu ; Jianfeng Shao ; Yuezhi Tao ; Guihua Zou ; ^{zouguihuazw@163.com}
• 关键词：Quantitative trait loci ; Rice weevil resistance ; Sorghum
• 刊名：Journal of Stored Products Research
• 出版年：2016
• 出版时间：October 2016
• 年：2016
• 卷：69
• 期：Complete
• 页码：166-171
• 全文大小：686 K
• 卷排序：69

文摘

An ultra-high density physical map was firstly used to map the QTLs for rice weevil resistance. A total of 21 QTLs for grain weight losses, flour production, and percentage kernels damaged were identified. The co-located QTLs affecting grain weight losses, flour production, and percentage kernels damaged were detected.