Detection of 6-Thioguanine by surface-enhanced Raman scattering spectroscopy using silver nanoparticles-coated silicon wafer
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- 作者：Hongli Lia ; Xiaoli Chongb ; Yufeng Chenb ; Lei Yanga ; Lan Luoa ; Bing Zhaob ; Yuan Tiana ; tianyuan@jlu.edu.cn" class="auth_mail" title="E-mail the corresponding author
- 关键词：Surface-enhanced Raman scattering ; Silver nanoparticles-coated silicon wafer ; 6-Thioguanine ; Internal standard
- 刊名：Colloids and Surfaces A: Physicochemical and Engineering Aspects
- 出版年：2016
- 出版时间：20 March 2016
- 年：2016
- 卷：493
- 期：Complete
- 页码：52-58
- 全文大小：2260 K
文摘
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The silver nanoparticles-coated silicon wafer (AgNPs@Si) was served as SERS substrate for the detection of 6-Thioguanine (6-TG).
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With the 521 cm−1 band of silicon as internal standard, band intensity ratio of 6-TG to silicon, that is I1303/I521, can be used for quantification.
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Figures of merit were evaluated (linear range, sensitivity, selectivity, recovery).
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The detection limit (S/N = 3) is 0.065 μmol L−1.