Towards pump-probe experiments of defect dynamics with short ion beam pulses

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• 作者：T. Schenkel ; S.M. Lidia ; C.D. Weis ; W.L. Waldron ; J. Schwartz ; A.M. Minor ; P. Hosemann ; J.W. Kwan
• 关键词：Pulsed ion beams ; Pump&ndash ; probe ; Point defects ; Ion implantation ; Semiconductors
• 刊名：Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
• 出版年：15 November, 2013
• 年：2013
• 卷：315
• 期：Complete
• 页码：350-355
• 全文大小：919 K

文摘

A novel, induction type linear accelerator, the Neutralized Drift Compression eXperiment (NDCX-II), is currently being commissioned at Berkeley Lab. This accelerator is designed to deliver intense (up to 3 脳 10p>11p> ions/pulse), 0.6 to 鈭?00 ns duration pulses of 0.05-1.2 MeV lithium ions at a rate of about 2 pulses per minute onto 1-10 mm scale target areas. When focused to mm-diameter spots, the beam is predicted to volumetrically heat micrometer thick foils to temperatures of 鈭?0,000 掳K. At lower beam power densities, the short excitation pulse with tunable intensity and time profile enables pump-probe type studies of defect dynamics in a broad range of materials. We briefly describe the accelerator concept and design, present results from beam pulse shaping experiments and discuss examples of pump-probe type studies of defect dynamics following irradiation of materials with intense, short ion beam pulses from NDCX-II.