Ultra-low reflection CuO nanowire array in-situ grown on copper sheet

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• 作者：Xingli Wang ; Xiaofeng Wu ; Long Yuan ; Keke Huang ; Shouhua Feng ; ^{shfeng@jlu.edu.cn}
• 关键词：Ultra-low reflectance materials ; Vertically aligned ; Light trapping ; Solar energy harvesting ; Optical instruments
• 刊名：Materials & Design
• 出版年：2017
• 出版时间：5 January 2017
• 年：2017
• 卷：113
• 期：Complete
• 页码：297-304
• 全文大小：2520 K
• 卷排序：113

文摘

CuO nanowires were orderly grown on Cu sheet, which show ultra-low reflection with the reflectance of 0.078% in 200-700 nm. The low reflection of CuO nanowires can be attributed to multiple reflection and absorption of incident light. These materials can be applied in improving the absorption of the inner-wall of sensitive optical instruments.