Young's modulus of ZnO microwires determined by various mechanical measurement methods
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- 作者：Hakseong Kim ; Un Seok Jung ; Soo In Kim ; Duhee Yoon ; Hyeonsik Cheong ; Chang Woo Lee ; Sang Wook Lee
- 关键词：ZnO microwire ; Young's modulus ; Nano indentation ; Atomic force microscope ; Optical interferometry
- 刊名：Current Applied Physics
- 出版年：February, 2014
- 年：2014
- 卷：14
- 期：2
- 页码：166-170
- 全文大小：968 K
文摘
The mechanical properties of ZnO microwires have been studied using three different methods: quasi-static flexural measurements using atomic force microscopy, static measurements using a nano indenter, and dynamic flexural measurements using optical interferometry. ZnO microwires were synthesized by chemical vapor deposition method, and the crystal structure and quality were examined using x-ray diffraction and photoluminescence spectroscopy. The Young's moduli were estimated using聽the measurement results from the three methods, and they showed consistent values in the range 67.5-79.4聽GPa for microwires with diameters of 1.8聽渭m聽卤聽100聽nm.