Methodology for information extraction from oscillograms and its application for high-impedance faults analysis
详细信息 查看全文
- 作者：Oureste Elias Batista ; oureste.batista@usp.br" class="auth_mail" title="E-mail the corresponding author ; Rogé ; rio Andrade Flauzino ; Marcel Ayres de Araujo ; Lucas Assis de Moraes ; Ivan Nunes da Silva
- 关键词：Power system analysis ; Fault diagnosis ; Oscillogram analysis ; High-impedance faults ; Power distribution faults ; Information extraction
- 刊名：International Journal of Electrical Power & Energy Systems
- 出版年：2016
- 出版时间：March 2016
- 年：2016
- 卷：76
- 期：Complete
- 页码：23-34
- 全文大小：2335 K
文摘
- •
The methodology helps locate and identify Single Line-to-Ground (SLG) faults.
- •
The technique does not make use of a previously established basis set.
- •
More than 80% correlation with the occurrence of high impedance fault.
- •
Almost 70% correlation with the location of high impedance fault.
- •
Great immunity to the fault resistance effect.