Elucidating the influences of mechanical bending on charge transport at the interfaces of organic light-emitting diodes

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• 作者：Huanyu Zhou ; Jin-Woo Park ; ^{jwpark09@yonsei.ac.kr}
• 关键词：Mechanical bending ; OLED ; Injection barrier ; Charge accumulation ; Carrier mobility
• 刊名：Thin Solid Films
• 出版年：2016
• 出版时间：30 November 2016
• 年：2016
• 卷：619
• 期：Complete
• 页码：281-287
• 全文大小：1372 K
• 卷排序：619

文摘

The change in performance of f-OLEDs after bending was studied in terms of charge carrier behavior. The bending of 8 mm radius induced permanent degradation of f-OLED with the stacking sequence of ITO/PEDOT:PSS/Super Yellow/Cs2CO3/Al. The bending stress changed electronic energy states of materials in OLED. Interfacial charge accumulation by the bending was confirmed by UPS.