Spectroscopic and dielectric investigations of tungsten ions doped zinc bismuth phosphate glass-ceramics
详细信息    查看全文
文摘
Pure and tungsten oxide doped ZnF2Bi2O3P2O5 glass-ceramics are prepared by the melt quenching and heat treatment techniques. These samples are characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), electron dispersive spectroscopy (EDS) and differential thermal analysis (DTA) techniques. The X-ray diffraction and the scanning electron microscopic studies have revealed the presence of BiPO4, ¦Á-Zn3(PO4)2, ¦Á-Zn(PO3)2, Zn3(PO4)2, WOF4, WOPO4, ¦Ã-Bi2WO6, Bi2W2O9, microcrystalline phases in these samples. FTIR and Raman studies exhibit bands due WO4 and WO6 units along with conventional phosphate groups. The optical absorption and electron spin resonance (ESR) spectra of present glass-ceramics indicate the co-existence of both W5+ and W6+ ions. The analysis of dielectric properties (dielectric constant, loss tan ¦Ä, a.c. conductivity) over a range of frequency and temperature suggests a gradual increase in semi conducting character with increase in the concentration of WO3. The studies on dielectric breakdown strength indicated the lowest insulating strength for 5.0 mol % of WO3 in the present samples.

© 2004-2018 中国地质图书馆版权所有 京ICP备05064691号 京公网安备11010802017129号

地址:北京市海淀区学院路29号 邮编:100083

电话:办公室:(+86 10)66554848;文献借阅、咨询服务、科技查新:66554700