Fin shape dependent variability for strained SOI FinFETs
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文摘

All the corrections suggested by reviewers incorporated with proper references in modified manuscript.

High driving current with strained channel but leakage is a problem.

OFF current can be reduced by change in fin shapes.

Rectangular and triangular fin shapes in FinFET are compared in terms of performance and process variation.

Triangular FinFET performance for low power applications is better under the influence of fin width and work function variations.

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