Analytic derivation of optimal imaging conditions for incoherent imaging in aberration-corrected electron microscopes

详细信息    查看全文

• 作者：Varat Intaraprasonk ; Huolin L. Xin ; David A. Muller
• 关键词：Annular dark field ; Scanning transmission electron microscope ; Aberration correction ; Depth sectioning ; Resolution
• 刊名：Ultramicroscopy
• 出版年：2008
• 出版时间：October 2008
• 年：2008
• 卷：108
• 期：11
• 页码：1454-1466
• 全文大小：904 K

文摘

The optimal lens parameters for incoherent imaging using third and fifth-order aberration-corrected electron microscopes are derived analytically. We propose simple models for the point spread function (PSF) and transfer function that give analytic formulae for the lateral resolution and depth resolution. We also derive an analytic formula for the contrast transfer function (CTF) in three dimensions and show that depth sectioning has an information limit equivalent to tomography with a missing cone of 90 minus the aperture angle.