Metrological self-check and evolution of metrology

详细信息    查看全文

• 作者：R. Taymanov ; K. Sapozhnikova
• 关键词：Metrological self-check of sensors ; Long-term calibration interval ; Intelligent sensor ; Evolution of metrology
• 刊名：Measurement
• 出版年：2010
• 出版时间：August 2010
• 年：2010
• 卷：43
• 期：7
• 页码：869-877
• 全文大小：205 K

文摘

There are growing indications of a crisis in conventional methods of metrological assurance for measuring instruments with built-in self-checking. This paper offers an analysis, looking in the first instance at sensors. An analogy between biological and technical evolution is discussed. It is argued that the future will see intelligent sensors and measuring systems being mass produced with inbuilt metrological self-checking, as well as the transition to a new stage in the evolution of metrological assurance of sensors.