Corneal sensitivity after small-incision lenticule extraction and laser in situ keratomileusis
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文摘
To longitudinally evaluate corneal sensitivity after small-incision lenticule extraction and compare the results with those in previous studies.

Setting

London Vision Clinic, London, United Kingdom.

Design

Retrospective case series.

Methods

Consecutive myopic eyes treated with small-incision lenticule extraction using the Visumax femtosecond laser were studied. Corneal sensitivity was measured centrally and at 4 paracentral locations using a Cochet-Bonnet esthesiometer preoperatively and 1 day, 1 week, and 1, 3, 6, and 12 months postoperatively. Results were compared with averaged results from previous laser in situ keratomileusis (LASIK) and small-incision lenticule extraction studies.

Results

The mean spherical equivalent was −6.85 diopters (D) ± 2.57 (SD). The mean age was 36 ± 11 years. After small-incision lenticule extraction, the preoperative mean central corneal sensitivity dropped from 54 mm preoperatively to 33 mm 1 day postoperatively, rising to 40 mm, 45 mm, 48 mm, 54 mm, and 55 mm over 12 months; it reached baseline at 6 months (P > .05). For 21 LASIK studies, the mean central corneal sensitivity dropped from 56 mm preoperatively to 6 mm at 1 day, rising to 14 mm, 23 mm, 34 mm, 45 mm, and 51 mm over 12 months. For 8 small-incision lenticule extraction studies, central corneal sensitivity dropped from 57 mm preoperatively to 39 mm at 1 week, then rose to 39 mm, 42 mm, 49 mm, 52 mm, and 54 mm over 12 months; it was higher than after LASIK at 1 week and 1, 3, and 6 months (P < .05).

Conclusion

Recovery of central corneal sensitivity to baseline was reached by 6 months after small-incision lenticule extraction and was higher than after LASIK for the first 6 months after surgery.

Financial Disclosure

Dr. Reinstein is a consultant to Carl Zeiss Meditec AG, has a proprietary interest in the Artemis technology (Arcscan, Inc.), and is an author of patents related to very high-frequency digital ultrasound administered by the Center for Technology Licensing at Cornell University, Ithaca, New York, USA. No other author has a financial or proprietary interest in any material or method mentioned.

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