Automated magnification calibration in transmission electron microscopy using Fourier analysis of replica images

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• 作者：Jeroen A.W.M. van der Laak ; Henry B.P.M. Dijkman and Martin M.M. Pahlplatz
• 关键词：Transmission electron microscopy ; Calibration ; Digital image analysis ; Pattern recognition ; Geometry
• 刊名：Ultramicroscopy
• 出版年：2006
• 出版时间：March 2006
• 年：2006
• 卷：106
• 期：4-5
• 页码：255-260
• 全文大小：306 K

文摘

The magnification factor in transmission electron microscopy is not very precise, hampering for instance quantitative analysis of specimens. Calibration of the magnification is usually performed interactively using replica specimens, containing line or grating patterns with known spacing. In the present study, a procedure is described for automated magnification calibration using digital images of a line replica. This procedure is based on analysis of the power spectrum of Fourier transformed replica images, and is compared to interactive measurement in the same images. Images were used with magnification ranging from 1,000× to 200,000×. The automated procedure deviated on average 0.10 % from interactive measurements. Especially for catalase replicas, the coefficient of variation of automated measurement was considerably smaller (average 0.28 % ) compared to that of interactive measurement (average 3.5 % ). In conclusion, calibration of the magnification in digital images from transmission electron microscopy may be performed automatically, using the procedure presented here, with high precision and accuracy.