Pulsed laser deposition and characterization of epitaxial CuInS2 thin films on c-plane sapphire substrates
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文摘
The epitaxial growth of CuInS2 thin films on single-crystal sapphire (0 0 0 1) substrates was first attempted by using pulsed laser deposition. A highly dense CuInS2 ceramic target with chalcopyrite structure was prepared by sintering high-purity (5N) powders in vacuum at 960 ¡ãC for an hour. CuInS2 thin films deposited at various temperatures all grew in a (1 1 2) preferred orientation, suggesting a three-dimensional island-like growth mechanism. When deposited at 700 ¡ãC, epitaxial growth of CuInS2 films on c-plane sapphire was achieved with an out-of-plane orientation of CuInS2 (1 1 2)|| sapphire (0 0 0 1) and in-plane orientation of CuInS2 . A typical rocking curve half width of 0.17¡ã demonstrates a high degree of crystallinity as well as excellent alignment of the CuInS2 films along [2 2 1], whereas in-plane two domains rotated by 180¡ã with respect to each other are found coexisting in the epilayers. High-quality epitaxial thin films will allow further research into the fundamental properties of CuInS2 absorber layers, which will eventually help to improve conversion efficiencies of CuInS2-based solar cells.

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