Dose-rate-dependent damage of cerium dioxide in the scanning transmission electron microscope
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- 作者：Aaron C. Johnston-Pecka ; aaron.johnston-peck@nist.gov" class="auth_mail" title="E-mail the corresponding author ; Joseph S. DuCheneb ; Alan D. Robertsb ; Wei David Weib ; Andrew A. Herzinga
- 关键词：Scanning transmission electron microscopy ; Point defects ; Beam damage ; Cerium dioxide
- 刊名：Ultramicroscopy
- 出版年：2016
- 出版时间：November 2016
- 年：2016
- 卷：170
- 期：Complete
- 页码：1-9
- 全文大小：2313 K
文摘
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Electron beam interactions introduce oxygen vacancies in CeO2 nanoparticles.
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ADF-STEM and EELS can track the reduction of CeO2.
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The reduced nanoparticles will oxidize in the microscope environment.
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There is no critical dose for the accumulation of detectable damage.
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The accumulation of detectable damage is dose rate dependent.