Stochastic testing of ADC—Step-Gauss method
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文摘
The article describes theoretical background and practical results of Analog-to-Digital Converters (ADC) stochastic test method “Multi-Gauss” that has been designed, developed and verified at the Department of Measurement of the Czech Technical University, FEE in Prague. It is suitable for testing of high-resolution AD converters (e.g. Σ–Δ or dither-based) or on the contrary ultra high-speed AD converters. The method is based on the histogram test driven by stochastic signal with defined probability density function (p.d.f.). Further enhancement that allows an estimation of frequency dependency of effective number of bits (ENOB) is also presented.