Optical characterization of photosensitive AMTIR-1 chalcogenide thin layers deposited by electron beam deposition
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文摘

Deposition of optical quality chalcogenide layers

Determination of the dispersion of the fabricated layer both in transparent and absorbing regions

Study of the effect of deposition parameters on optical properties

Study of the photosensitivity of these layers

Study of the stability of the fabricated layers

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