Influence of Hf content on structure and electric properties of PHT thin films with self-buffered layer by PLD
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- 作者：Junfeng Li ; Lijunfeng0827@outlook.com" class="auth_mail" title="E-mail the corresponding author ; Jun Zhu ; Zhipeng Wu ; Wenbo Luo
- 关键词：Lead hafnate titanate ; Morphotropic phase boundary ; Ferroelectric thin film ; Pulsed-laser deposition (PLD) ; Remnant polarization
- 刊名：Vacuum
- 出版年：2016
- 出版时间：December 2016
- 年：2016
- 卷：134
- 期：Complete
- 页码：69-72
- 全文大小：799 K
文摘
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Owing to the difference of Hf content, three kinds of PHT films show different structures and electric performances.
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PbHf0.48Ti0.52O3 shows good electric performance due to the coexistence of two phases around MPB.
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PHT shows better fatigue performance than other ferroelectric films, which indicates PHT have a good prospect in FRAM.