Method of quantifying surface roughness for accurate adhesive force predictions

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• 作者：Casey Q. LaMarche^a ; Stuart Leadley^b ; Peiyuan Liu^a ; Kevin M. Kellogg^a ; Christine M. Hrenya^a ; ^{hrenya@colorado.edu}
• 关键词：Roughness ; Atomic Force Microscope ; AFM ; Adhesion ; Van der Waals ; Particle Adhesion
• 刊名：Chemical Engineering Science
• 出版年：2017
• 出版时间：2 February 2017
• 年：2017
• 卷：158
• 期：Complete
• 页码：140-153
• 全文大小：1257 K
• 卷排序：158

文摘

The effects of surface roughness on van der Waals forces are reviewed. Theories for predicting adhesion forces in the presence of roughness are examined. Prior techniques of quantifying roughness are discussed and a new methodology is presented. Artifacts are discovered, which affect adhesion predictions and are removed with the new method. Adhesion force predictions are in good agreement with measurements after removing artifacts.