Single event effect characterization of the mixed-signal ASIC developed for CCD camera in space use
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- 作者：Hiroshi Nakajima ; Mari Fujikawa ; Hideki Mori ; Hiroaki Kan ; Shutaro Ueda ; Hiroko Kosugi ; Naohisa Anabuki ; Kiyoshi Hayashida ; Hiroshi Tsunemi ; John P. Doty ; Hirokazu Ikeda ; Hisashi Kitamura ; Yukio Uchihori
- 关键词：X-ray ; ASIC ; CCD camera ; Single event effect
- 刊名：Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- 出版年：11 December, 2013
- 年：2013
- 卷：731
- 期：Complete
- 页码：166-171
- 全文大小：1240 K
文摘
We present the single event effect (SEE) tolerance of a mixed-signal application-specific integrated circuit (ASIC) developed for a charge-coupled device camera onboard a future X-ray astronomical mission. We adopted proton and heavy ion beams at HIMAC/NIRS in Japan. The particles with high linear energy transfer (LET) of is used to measure the single event latch-up (SEL) tolerance, which results in a sufficiently low cross-section of /(Ion脳ASIC). The single event upset (SEU) tolerance is estimated with various kinds of species with wide range of energy. Taking into account that a part of the protons creates recoiled heavy ions that have higher LET than that of the incident protons, we derived the probability of SEU event as a function of LET. Then the SEE event rate in a low-earth orbit is estimated considering a simulation result of LET spectrum. SEL rate is below once per 49 years, which satisfies the required latch-up tolerance. The upper limit of the SEU rate is derived to be 1.3脳10鈭? events/s. Although the SEU events cannot be distinguished from the signals of X-ray photons from astronomical objects, the derived SEU rate is below 1.3% of expected non-X-ray background rate of the detector and hence these events should not be a major component of the instrumental background.