Analysis and modeling of flicker noise in lateral asymmetric channel MOSFETs
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文摘

Flicker noise behavior in presence of lateral asymmetry is studied.

Noise model based on Klaassen Prins method underestimates 1/f noise in such devices.

New model is developed and the physics behind noise underestimation is discussed.

This study also explain 1/f noise degradation observed in real devices.

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