Atomic force microscopy enabled roughness analysis of nanostructured poly (diaminonaphthalene) doped poly (vinyl alcohol) conducting polymer thin films
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- 作者：Anil Kumar Bajpaia ; akbmrl@yahoo.co.in" class="auth_mail" title="E-mail the corresponding author ; Rinkesh Bhattc ; Ravi Katareb
- 关键词：Atomic force microscopy ; Surface skewness ; Coefficient of kurtosis
- 刊名：Micron
- 出版年：2016
- 出版时间：November 2016
- 年：2016
- 卷：90
- 期：Complete
- 页码：12-17
- 全文大小：1617 K
文摘
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Conducting monomer diaminonaphthalene and its polymer are doped into polyvinyl alcohol to fabricate a thin film.
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The atomic force microscopy was used to study morphology of films.
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Dopring of monomer and polymer caused the surface to become more rough.