文摘
The concentrations of 22 elements (Be, Na, Mg, Ca, Sc, Ti, V, Cr, Mn, Fe, Co, Cu, Zn, Ga, Se, Rb, Sr, Y, Zr, Cd, Cs, and Pb) in wheat grains and their provenance soils from Hebei and Henan provinces in China were analyzed by high resolution inductively coupled plasma mass spectrometry (HR-ICP-MS) and X-ray fluorescence (XRF). The relationships of concentrations of 22 elements between wheat grain and soil were studied. The elements associated with parent soil were used to discriminate wheat origin with principal component analysis (PCA) and linear discriminant analysis (LDA). It was verified that significant correlations existed between the elements Cr, Mn, Ga, Rb, Sr, Zr, and Cd in wheat grain and its provenance soil. The models built with these seven elements obtained 95 % of total correct classification for test samples. These results laid the foundation for the application of multi-element fingerprinting technique for food geographical origin.