Substrate-induced dielectric polarization in thin films of lead-free (Sr<sub>0.5sub>Bi<sub>0.5sub>)<sub>2sub>Mn<sub>2-xsub>Ti<sub>xsub>O<sub>6-δsub> perovskites grown by pulsed laser deposition
Highly oriented SrBiMn2-xTixO6 thin films are successfully fabricated by PLD. Thicknesses between 80 and 900 nm depending on x, substrate-type and chamber pressure. Compositional A-segregation controlled by the STO substrate orientation. Dielectric response analyzed under impedance and modulus formalisms. Relaxor phenomena obtained related to NPRs formation and compositional scenario.