Series resistance contribution of majority carriers in CELLO impedance analysis: Influence of wafer thickness variation
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- 作者：Jan-Martin Wagner ; jwa@tf.uni-kiel.de" class="auth_mail" title="E-mail the corresponding author ; Andreas Schü ; tt ; Jü ; rgen Carstensen ; Helmut Fö ; ll
- 关键词：LBIC ; CELLO impedance analysis ; Wafer thickness map ; High-efficiency silicon solar cells ; PERC structure ; Series resistance
- 刊名：Solar Energy Materials and Solar Cells
- 出版年：2016
- 出版时间：March 2016
- 年：2016
- 卷：146
- 期：Complete
- 页码：129-134
- 全文大小：7025 K
文摘
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CELLO obtains spatially resolved time constants describing photocurrent extraction.
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Local ohmic losses can be analyzed by light with varying penetration depth.
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For PERC cells, majorities-related time constants are large, possibly dominant.
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Majorities’ ohmic losses at point contacts are obtained by local laser illumination.
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Losses depending on wafer thickness and laser penetration depth yield thickness map.