Effects of temperature and span amplitude on fretting corrosion behavior of tin-plated electrical contacts

详细信息    查看全文

• 作者：Min-Jung Kim^a ; Ho-Kyung Kim^b ; ^{kimhk@seoultech.ac.kr}
• 关键词：Fretting corrosion ; Electric contact ; Failure lifetime
• 刊名：Microelectronics Reliability
• 出版年：2017
• 出版时间：February 2017
• 年：2017
• 卷：69
• 期：Complete
• 页码：80-87
• 全文大小：1481 K
• 卷排序：69

文摘

Electric failure lifetime was found to decrease with increase in the testing temperature. A formula for lifetime prediction was developed by applying the Arrhenius equation. The lifetime can be predicted within a factor of two.