Highly oriented crystal growth of nanocrystalline bismuth telluride thin films with anisotropic thermoelectric properties using two-step treatment
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文摘
Bi2Te3 thin films were deposited by radiofrequency magnetron sputtering. Deposited Bi2Te3 thin films were treated with two-step method. Resulting Bi2Te3 thin films obtained high crystallinity and crystal orientation. In-plane and cross-plane thermoelectric properties were estimated at RT. In-plane power factor exhibited 4 times higher than that of cross-plane.

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