Pt/Re and platinum PIEs were used to measure trace quantities of Am and Pu. PIEs offer superior ion yield over traditional single filament TIMS sources. An 1100% boost in Am ion yield was observed using Pt/Re PIEs. Pt/Re PIEs exhibited 550% improvement in Pu ionization efficiency. Platinum PIEs show an additional 134% boost in Pu ion yield over Pt/Re PIEs.