On the limitations of transimpedance amplifiers as tools for low-frequency noise characterization

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• 作者：Mattia Borgarino ; Giovanni Betti Beneventi ; Valerio Doga ; Paolo Pavan
• 关键词：Low-frequency noise ; Noise characterization ; Noise modeling ; Electrical characterization ; Semiconductor device reliability ; Transimpedance amplifier
• 刊名：Microelectronics Journal
• 出版年：February, 2014
• 年：2014
• 卷：45
• 期：2
• 页码：152-158
• 全文大小：718 K

文摘

An experimental set-up for the characterization of low-frequency noise on two terminal devices is reported. The experimental set-up is based on the use of the commercial transimpedance amplifier (TA) EG&G5182. This paper addresses the influence of the TA on the noise characterization process by describing the TA as a non-ideal operational amplifier with a feedback resistor. The impact of the TA finite input resistance and voltage gain is highlighted through comparison with measurements carried out on resistors and diodes.