Effects of cytosine methylation on DNA morphology: An atomic force microscopy study
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- 作者：V. Cassinaa ; valeria.cassina@unimib.it" class="auth_mail" title="E-mail the corresponding author ; M. Manghib ; D. Salernoa ; A. Tempestinic ; V. Iadarolaa ; L. Nardoa ; S. Brioschia ; F. Mantegazzaa
- 关键词：DNA methylation ; Atomic force microscopy (AFM) ; Persistence length
- 刊名：Biochimica et Biophysica Acta (BBA) - General Subjects
- 出版年：2016
- 出版时间：January 2016
- 年：2016
- 卷：1860
- 期：1
- 页码：1-7
- 全文大小：1458 K
文摘
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Atomic force microscopy on single molecules of DNA at different degree of methylation.
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Quantitative characterization of DNA stiffness by means of persistence length measure.
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From Worm Like Chain model to an improved theoretical model for DNA conformation
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Development of tracking procedure for quantitative AFM images analysis