Simulation of phase transformation kinetics in thin films under a constant nucleation rate
详细信息 查看全文
- 作者：M.M. Moghadama ; ; E.L. Panga ; T. Philippeb ; P.W. Voorheesa
- 关键词：Thin film ; Kinetics ; Phase transformation ; Crystallization ; Constant nucleation rate ; JMAK theory ; Level-set method
- 刊名：Thin Solid Films
- 出版年：2016
- 出版时间：1 August 2016
- 年：2016
- 卷：612
- 期：Complete
- 页码：437-444
- 全文大小：1149 K
文摘
- •
The Avrami exponent and rate constant change with the thickness of a film.
- •
The grain size distribution is predicted for phase transformation in thin films.
- •
The final grain size in the thin film depends on the film thickness.
- •
The characteristic length scale is determined by the grain size and film thickness.
- •
This characteristic length plays an important role on the growth dimensionality.