Surface contributions to the XPS spectra of nanostructured NiO deposited on HOPG
详细信息    查看全文
文摘
In this work we present an in situ X-ray photoelectron spectroscopy (XPS) study of the growth of NiO on highly ordered pyrolitic graphite (HOPG). The XPS spectra were measured as a function of the equivalent NiO coverage. Also, ex-situ atomic force microscopy (AFM) images were taken for some of these stages in order to follow the morphology of the NiO deposits. For low coverages the lineshapes of the Ni 2p spectra differ strongly from those of bulk NiO. This has been related to the large surface contribution. The O 1s XPS spectra also show a surface related structure which follows the same trend observed in the Ni 2p spectra.

© 2004-2018 中国地质图书馆版权所有 京ICP备05064691号 京公网安备11010802017129号

地址:北京市海淀区学院路29号 邮编:100083

电话:办公室:(+86 10)66554848;文献借阅、咨询服务、科技查新:66554700