Quadrupole lens-free multiple-profile diagnostics for emittance measurement of laser wakefield accelerated electron beams

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• 作者：M. Krůs^a ; ^b ; ^{krus@fzu.cz" class="auth_mail" title="E-mail the corresponding author} ; T. La&scaron ; tovička^a ; T. Levato^a
• 关键词：Laser wakefield acceleration ; Transverse emittance measurement ; Diagnostics ; Multiple screen technique ; Iterative Bayesian unfolding
• 刊名：Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
• 出版年：2016
• 出版时间：21 February 2016
• 年：2016
• 卷：810
• 期：Complete
• 页码：32-36
• 全文大小：886 K

文摘

A quadrupole lens-free diagnostic is a simple single shot method which can be used to measure the electron beam transverse emittance. LANEX screens are used as profile monitors due to the high yield of visible photons which can be easily detected by standard camera sensors. This type of minimally destructive diagnostics is particularly suitable for electron beams accelerated by the laser wakefield mechanism where the basic parameters of such beams fluctuate shot-to-shot mainly during the beam optimizing process. It allows to simultaneously measure the beam divergence, position, profile, pointing, and charge. The numerical study of the diagnostics performance and applicability range is presented and its limits are discussed. The influence of the LANEX screen multiple Coulomb scattering is studied by means of G<span class="smallcaps">EANT4span>; the unfolding procedure for multiple scattering contribution is presented.