Variability modeling in near-threshold CMOS digital circuits
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- 作者：M. Slimania ; mariem.slimani@telecom-paristech.fr" class="auth_mail" title="E-mail the corresponding author ; F. Silveirab ; silveira@fing.edu.uy" class="auth_mail" title="E-mail the corresponding author ; P. Matherata
- 关键词：Sub-threshold logic ; Near-threshold operation ; Variability ; Modeling
- 刊名：Microelectronics Journal
- 出版年：2015
- 出版时间：December 2015
- 年：2015
- 卷：46
- 期：12
- 页码：1313-1324
- 全文大小：883 K
文摘
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Variability is a strong limitation for sub and near-threshold digital CMOS.
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Variability moves the minimum energy point towards the near-threshold region.
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We propose a simple model for assessing the delay-energy trade-off with variability.
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The model is validated in a 32 bit adder and a 8 bit multiplier test cases.
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We derive an analytical solution of the VDD for minimum energy with variability.