Pb quantification of CdZnTe microheterogeneities complimented by SEM, IR microscopy, EDX, and TOF-SIMS
详细信息 查看全文
- 作者：Mary Bliss ; David C. Gerlach ; John B. Cliff ; Mychailo B. Toloczko ; Debra S. Barnett ; Guido Ciampi ; Kelly A. Jones ; Kelvin G. Lynn
- 关键词：CdZnTe ; Frisch ; Weighting potential ; Charge collection
- 刊名：Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- 出版年：2007
- 出版时间：21 August 2007
- 年：2007
- 卷：579
- 期：1
- 页码：138-140
- 全文大小：620 K
文摘
High-resistivity crystals of CdZnTe are made using low-pressure Bridgman. The success of any doping scheme depends on its effectiveness in overcoming trace contamination and variations in processing. Multiple imaging and quantitative techniques gave highly complimentary information relating to spatial heterogeneity of the cadmium zinc telluride (CZT). Secondary Ion Mass Spectroscopy (SIMS) has good sensitivity and can quantitate trace elements in areas less than 150 bc;m in diameter. PNNL has SIMS standards for several key elements and can extrapolate for other elements. A heavily Pb-doped sample (0.1 atm % ) was characterized to determine the distribution of lead and its potential impact on precipitates.