Effect of electrical field strength applied by PEF processing and storage temperature on the outgrowth of yeasts and moulds naturally present in a fresh fruit smoothie
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- 作者：R.A.H. Timmermansa ; rian.timmermans@wur.nl" class="auth_mail" title="E-mail the corresponding author ; A.L. Nederhoffa ; M.N. Nierop Groota ; M.A.J.S. van Boekelb ; H.C. Mastwijka
- 关键词：Pulsed electric field (PEF) ; Electrical field strength ; Shelf life ; Yeast and moulds ; Competition ; Global modeling ; Visual spoilage
- 刊名：International Journal of Food Microbiology
- 出版年：2016
- 出版时间：2 August 2016
- 年：2016
- 卷：230
- 期：Complete
- 页码：21-30
- 全文大小：630 K
文摘
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Untreated fruit smoothie gets spoiled by the outgrowth of yeasts.
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PEF inactivation of yeasts favours outgrowth of moulds.
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Global modeling was used to establish the relation between critical process parameters.
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Electrical field strength and storage temperature influence outgrowth.
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Relation between visual observations and plate counts was established for moulds.