Characterization of Pr:LuAG scintillating crystals for X-ray spectroscopy
详细信息    查看全文
文摘
The main features of the Pr doped Lu3Al5O12 (Pr:LuAG) scintillating crystals for X-ray spectroscopy applications have been studied using different radioactive sources and photo-detectors. Pr:LuAG is cheaper, compared to a Germanium detector, but with remarkable properties which make it useful for many applications, from fundamental physics measurements to the PET imaging for medical purposes: high density, elevate light yield, fast response, high energy resolution, no hygroscopicity. A sample of Pr:LuAG crystals with 14 mm×14 mm surface area and 13 mm thickness and a NaI crystal of the same surface and 26 mm thickness used as a reference have been characterized with several radioactive sources, emitting photons in the range 100–1000keV. Different light detectors were adopted for the Pr:LuAG studies, sensitive to its UV emission (peak at 310 nm): a 3 in. PMT (Hamamatsu R11065) and new arrays of Hamamatsu SiPM S13361, with siliconic resin as a window. Preliminary results are presented on the performance of the Pr:LuAG crystals, to be mounted in a pan id="mmlsi0001" class="mathmlsrc">pan class="formulatext stixSupport mathImg" data-mathURL="/science?_ob=MathURL&_method=retrieve&_eid=1-s2.0-S016890021501476X&_mathId=si0001.gif&_user=111111111&_pii=S016890021501476X&_rdoc=1&_issn=01689002&md5=299a5e28c05223e52b72b88774ff468f" title="Click to view the MathML source">2×2pan>pan class="mathContainer hidden">pan class="mathCode">2×2pan>pan>pan> array to be tested in the 2015 run of the FAMU experiment at RIKEN-RAL muon facility. The goal is the detection of the X-rays (around 130 keV) emitted during the de-excitation processes of the muonic hydrogen after the excitation with an IR laser with wavelength set at the resonance of the hyperfine splitting, to measure the muonic atom proton radius with unprecedented precision.

© 2004-2018 中国地质图书馆版权所有 京ICP备05064691号 京公网安备11010802017129号

地址:北京市海淀区学院路29号 邮编:100083

电话:办公室:(+86 10)66554848;文献借阅、咨询服务、科技查新:66554700