Investigations on the interfacial capacitance and the diffusion boundary layer thickness of ion exchange membrane using electrochemical impedance spectroscopy
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- 作者：Wenjuan Zhanga ; Jun Maa ; majun@hit.edu.cn" class="auth_mail" title="E-mail the corresponding author ; Panpan Wanga ; Zhenghui Wangb ; Fengmei Shic ; Huiling Liua ; hlliu2002@163.com" class="auth_mail" title="E-mail the corresponding author
- 关键词：AC ; alternating current ; A.C. ; atomic composition (%) ; AEM ; anion exchange membrane ; CEM ; cation exchange membrane ; CPE ; constant phase element ; DBL ; diffusion boundary layer ; ED ; electrodialysis ; EDL ; electrical double layer ; EIS ; electrochemical impedance spectroscopy ; IEC ; ion exchange capacity ; IEM ; ion exchange membrane ; OCP ; open circuit potential ; RED ; reverse electrodialysis ; SEM ; scanning electron microscope ; TSP ; tangential streaming potential ; XPS ; X-ray photoelectron spectroscopy
- 刊名：Journal of Membrane Science
- 出版年：2016
- 出版时间：15 March 2016
- 年：2016
- 卷：502
- 期：Complete
- 页码：37-47
- 全文大小：3038 K
文摘
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Ion exchange membrane and interfacial properties were studied by EIS.
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SEM, XPS and zeta potential were used to characterize the membranes.
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Diffusion boundary layer thickness was estimated with the equation
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Electrical double layer's electrical parameters were consistent with Debye equation.
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The diffusion boundary layer thickness changed with operational conditions.