Identification of forgeries in historical enamels by combining the non-destructive scanning XRF imaging and alpha-PIXE portable techniques
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- 作者：Hellen Cristine Santosa ; santos@lns.infn.it" class="auth_mail" title="E-mail the corresponding author ; Claudia Caliria ; Lighea Pappalardoa ; b ; Roberto Catalanoa ; c ; Andrea Orlandoa ; d ; Francesca Rizzoa ; e ; Francesco Paolo Romanoa ; b
- 关键词：Cultural heritage ; Pigments ; Enamels ; Elemental distribution ; X-ray fluorescence
- 刊名：Microchemical Journal
- 出版年：2016
- 出版时间：January 2016
- 年：2016
- 卷：124
- 期：Complete
- 页码：241-246
- 全文大小：2032 K
文摘
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PIXE and scanning XRF were combined for the investigation of historical enamels.
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PIXE compositional data were not consistent with ones of historical enamels.
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Scanning XRF detected Zn, Cr and As, as expected in enamels from the XVIII century AD.
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A Non Negative Matrix Analysis on XRF images allowed to detect a modern cadmium lithopone in the red enamels.
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Results addressed the question of authenticity of objects classified as modern copies.