文摘
A common way of evaluating the quality of a measuring device is to use it to measure the properties of some test objects, thus obtaining a large number of samples whose values are then compared to a known ground truth. Such a process tends to be labor intensive and time-consuming. A more convenient and elegant alternative is to statistically propagate the uncertainty of the measurement process throughout the computation chain. A clear advantage of such an approach over the conventional sampling-based method is its practical nature: it allows the continuous changes in input parameter values and sampling conditions, which are common in real-time applications, to be instantly taken into account.