Direct correlations between XPS analyses and growth film by chronopotentiometry on InP in liquid ammonia (−55 °C)
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- 作者：A.-M. Gonç ; alves ; anne-marie.goncalves@uvsq.fr" class="auth_mail" title="E-mail the corresponding author ; C. Njel ; D. Aureau ; A. Etcheberry
- 关键词：Passivation ; Semiconductor electrochemistry ; Galvanostatic methods ; InP ; Liquid ammonia ; XPS
- 刊名：Applied Surface Science
- 出版年：2017
- 出版时间：1 January 2017
- 年：2017
- 卷：391
- 期：part_PA
- 页码：44-48
- 全文大小：523 K
文摘
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Anodic galvannostatic treatment on n‐InP is carried out in liquid ammonia (−55 °C) under illumination.
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Whatever the anodic charge, a phosphazene like film is revealed by XPS without thickening of the layer.
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The film growth requires a nucleation step which is followed by a phosphazene coalescence phenomenon in the two dimensions of the surface.
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A monolayer film of phosphazene is suggested and an excess of charge is observed which can be assigned to ammonia oxidation.