Residual stresses in thermal barrier coatings measured by photoluminescence piezospectroscopy and indentation technique

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• 作者：X. Zhao and P. Xiao
• 关键词：Thermal barrier coatings ; Stresses ; Young's modulus ; Photoluminescence piezospectroscopy ; Indentation
• 刊名：Surface and Coatings Technology
• 出版年：2006
• 出版时间：5 October 2006
• 年：2006
• 卷：201
• 期：3-4
• 页码：1124-1131
• 全文大小：444 K

文摘

Residual stresses in electron beam physical vapour deposition (EB-PVD) thermal barrier coatings (TBCs) have been measured by photoluminescence piezospectroscopy (PLPS). It was found that the macro-stress, caused by the thermal mismatch between the substrate and the coating, decreases from the TBC/TGO interface to the top surface. The Young's modulus, measured on the cross-section of EB-PVD coating by nano-indentation, was also found to decrease from TBC/TGO interface to top surface. The variation of Young's modulus can be explained by change in the contact area of TBC under macro-stress. A model was employed to examine the contact area in relation to the stresses. And the stresses estimated based on results from nano-indentation measurements showed the same trend as that obtained from PLPS.