Structural phototransformation of WO₃ thin films detected by photoacoustic analysis

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• 作者：Argelia Pé ; rez Pacheco ; ^{ekargy@hotmail.com} ; ^{argelia@fisica.unam.mx} ; C. Oliva Montes de Oca ; R. Castañ ; eda-Guzmá ; n ; A. Esparza Garcí ; a
• 关键词：Thin films ; Tungsten oxide ; Phototransformation ; Photoacoustic analysis ; Raman spectroscopy
• 刊名：Applied Surface Science
• 出版年：2012
• 出版时间：15 November, 2012
• 年：2012
• 卷：261
• 期：Complete
• 页码：327-331
• 全文大小：1063 K

文摘

The photoacoustic technique (PA) was used to detect the phase transformation from amorphous to crystalline state of tungsten oxide (WO₃) thin films induced by UV pulsed laser radiation at low energy (<1.5 mJ). The evolution of photoacoustic signal was studied by a correlation analysis, comparing successive signals at fluences ranging from 0 to 20 mJ/cm². In this interval, it was possible to observe structural changes and the ablation threshold in films due to incident laser fluence effect. Thin films of WO₃ were deposited by DC reactive magnetron sputtering over glass substrates at different deposition times. The results obtained by correlation analysis were compared with Raman spectroscopy data.