method for determination of the grain size distribution from powder diffraction line profile

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• 作者：Roman Pielaszek
• 刊名：Journal of Alloys and Compounds
• 出版年：2004
• 出版时间：17 November 2004
• 年：2004
• 卷：382
• 期：1-2
• 页码：128-132
• 全文大小：176 K

文摘

Well-established Scherrer method allows for determination of the average grain size R of a crystalline powder by measurement of full width at half maximum (FWHM) of the diffraction peak profile. We propose an enhancement of this classical method. Measurement of two widths of the same peak, allows for two parameters to be distinguished: the average grain size R and dispersion of sizes σ. These parameters are sufficient to draw grain size distribution (GSD) curve, that is much more informative than a single size parameter R.

We propose to measure widths at 1/5 and 4/5 of the peak maximum ( and , respectively). A simple algebraic formula that converts measured and values into R and σ is presented. The method proposed in this paper is especially sensitive in case of a broad diffraction maxima, i.e. for nano-sized polycrystals.