Soft X-ray spectrometer on the HT-7 tokamak

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• 作者：Yunfeng ; Liang ; Xiejin ; Yin ; Zishen ; Fang ; Rongqing ; Liang
• 刊名：Fusion Engineering and Design
• 出版年：1997
• 出版时间：March, 1997
• 年：1997
• 卷：34-35
• 期：Complete
• 页码：201-204
• 全文大小：231 K

文摘

Temporally and spatially resolved profiles of electron temperatures in the HT-7 superconducting tokamak are measured during a single shot with a soft X-ray spectrometer system. The plasma soft X-ray emission (2-30 keV) was measured by the Si(Li) detector system with an energy resolution of 300 eV. This diagnostic system provides a useful tool to obtain the HT-7 electron temperature profiles with good time and spatial resolutions.