In-situ STM and XRD studies on Nb-H films: Coherent and incoherent phase transitions
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- 作者：Vladimir Burlaka ; vburlaka@material.physik.uni-goettingen.de" class="auth_mail" title="E-mail the corresponding author ; Stefan Wagner ; Astrid Pundt
- 关键词：Thin films ; Precipitation ; Phase transition ; Interstitial alloys ; Scanning Tunnelling Microscopy (STM) ; X-ray diffraction (XRD)
- 刊名：Journal of Alloys and Compounds
- 出版年：2015
- 出版时间：5 October 2015
- 年：2015
- 卷：645
- 期：supp_S1
- 页码：S388-S391
- 全文大小：991 K
文摘
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Hydride formation found in 25 nm Nb–H films.
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Critical film thickness for coherent-to-incoherent phase transition confirmed.
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Size and spatial distribution of hydrides controlled by the coherency state.
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Invisibility of small coherent hydrides in XRD pattern.