Modelling Electronic Circuit Failures using a Xilinx FPGA System
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- 作者：Thomas E. Carney ; Richard P. McWilliam ; Alan Purvis ; alan.purvis@durham.ac.uk" class="auth_mail" title="E-mail the corresponding author
- 关键词：FPGA ; Hardware-in-loop ; Fault Tolerance ; TMR ; Fault Injection
- 刊名：Procedia CIRP
- 出版年：2015
- 出版时间：2015
- 年：2015
- 卷：38
- 期：Complete
- 页码：277-282
- 全文大小：413 K
文摘
FPGAs are a ubiquitous electronic component utilised in a wide range of electronic systems across many industries. Almost all modern FPGAs employ SRAM based configuration memory elements which are susceptible to radiation induced soft errors. In high altitude and space applications, as well as in the nuclear and defence industries, such circuits must operate reliably in radiation-rich environments. A range of soft error mitigation techniques have been proposed but testing and qualification of new fault tolerant circuits can be an expensive and time consuming process. A novel method for simulating radiation-induced soft errors is presented that operates entirely within a laboratory environment and requires no hazardous exposure to radiation or expensive airborne test rigs. A system utilising modular redundancy is then implemented and tested under the new method. The test system is further demonstrated in conjunction with a software flight simulator to test single electronic modules in the context of active service on board a passenger aircraft and the effects of failure under radiation induced soft errors are observed. Our research proposes a test regime in which design strategies for self-healing circuits can be compared and demonstrated to work.